The picture frame shear test method achieved some popularity in the early days of composite materials development when few other shear test methods existed. But as the two- and three-rail shear test ...

Loaded board testing pays for itself by reducing field returns and bone-pile scrap. You seldom read an article about PCBs or semiconductors without encountering test-related phrases and acronyms. Cost ...

Test and programming fixtures are great time-savers for anyone who needs to deal with more than a handful of PCBs. Instead of plugging in connectors (or awkwardly holding probe tips or wires) to ...

Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

Wireless fixtures for in-circuit testing (ICT) have been available for more than 15 years and have no equal in testing high node-count complex circuit boards. However, there are other hidden ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...